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Search for "drain current compact model" in Full Text gives 1 result(s) in Beilstein Journal of Nanotechnology.
Metal oxide-graphene field-effect transistor: interface trap density extraction model
Beilstein J. Nanotechnol. 2016, 7, 1368–1376, doi:10.3762/bjnano.7.128
- that can later be used in drain current model is highlighted as a major advantage of the model. Keywords: drain current compact model; interface trap distribution; metal-oxide-graphene field-effect transistor (MOGFET); surface potential; Introduction Graphene has recently attracted a lot of attention
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